Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Maxtaform 150 mesh, Nickel
Maxtaform grids with clean and smooth edges, firm support, and a large open area. 3 mm diameter, 0.75 mil thickness.
Grid: Nickel
Pitch: 165 µm
Hole: 131 µm
Bar: 34 µm
:
Morrell Instrument Company Inc CFI PLAN FLUR100X/1.30/0.20OIL
NC3849807 CFI PLAN FLUR100X/1.30/0.20OIL
Electron Microscopy Sciences SEM Mount Hitachi M4 Combination 45°-90°, 1" head, 1/2" height, Aluminum
Combination 45 degree-90 degree SEM specimen mount for use with Hitachi M4. Made from ultra-pure aluminum.
Head: 1-1/4"
Height: 1/2"
Electron Microscopy Sciences Microscope Graticule NE2 Verticle, 19 mm, 10 mm with 0.1 mm subdivisions
These scales are used for the measuring of lengths of specimen or distances between points on a variety of different shaped objects. By dividing the division of the chosen graticule by the magnification of the objective one obtains an approximate value that each division will represent on the stage. Vertical micrometer scale.
Size: 19 mm
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/2-2C, 200 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 2.0 µm spacing.
Mesh: 200
Material: Copper
Electron Microscopy Sciences Crossed Gauge Lines Microscope Graticule NE 54, 21mm
Use as crossed lines, but for the measuring of distances between thelines. Greater accuracy can be obtained by locatng the specimen detail between the graticules gauge pair.
Size: 21mm
Divisions: Two vertical lines 0.2 mm apart
Electron Microscopy Sciences EMS Gold Aperture with 20 µm hole, 3 mm O.D., 0.12 mm thick
Advanced techniques of thin metal film application permits the apertures to retain a clean hole edge during prolonged beam exposure. Ultra-thin, half-micron design discourages contaminant accumulation and stabilizes astigmatic conditions to provide longer life. Conventional mechanical cleaning involving costly down-time is no longer necessary. Because the foil is ultra thin, care must be taken when handling the gold foil apertures.
Size: 20 µm
O.D.: 3 mm
Thickness: 0.12 mm
Electron Microscopy Sciences Grid Storage Box 50-Capacity-Clear Cover
Storage for 50 grids in deep diamond-shaped wells. All wells are identified. The base is resistant to organics and reactions can be carried out on grid-mounted samples in the wells. Complete with grid recording card.
Electron Microscopy Sciences BEEM Dial-A-Grid & Block Storage
Two tone color coded plastic box with insert which has 24 letter-labeled crossed slots and 2 cavities for block storage. A rotating protection plate covers the slots and allows for exposure of one grid at a time. There are two additional cavities for block storage. BEEM Is A Registered Trademark of Better Equipment For Electron Microscopy, Inc.
Electron Microscopy Sciences MXS Calibration Standard Mount Certified For SEM, Spacing
Certified for scanning electron microscope calibration standard.
Electron Microscopy Sciences High Resolution Magnification Calibration 150-2D For AFM
Model 150-2D is a very high resolution reference and traceable standards for magnification calibration of AFM, SEM, Auger, and FIB. It has a precision, holographic pattern that provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
The period is 144 nm pitch, two-dimensional array that is accurate to +/- 1 nm (calibration certificate will have actual pitch.) Surface: Aluminum bumps on Silicon, 4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.
For SEM an independent analytical lab has tested this specimen in a FE-SEM and found that the pattern was very uniform and the specimen was easy to image. No significant charging was observed in the voltage range 1-20 kV. Comes with a non-traceable, manufacturer's certificate.
Electron Microscopy Sciences Pharmaceutical PSA Pattern Graticle G-57, 21 mm, Glass sandwich
This graticule was designed for the pharmaceutical industry. However, it is also useful where particle size considerations are restricted to 10 mm and 25 mm. Dots and circles give quick references for these two sizes. In addition a scale is incorporated. The microscope must be calibrated when ordering this graticule, such that the circle must equate to 1 mm on the microscope stage.
Size: 21 mm
Surface: Glass sandwich
Electron Microscopy Sciences Stage Micrometer S5, Horizontal Scale, 20 mm Length
Stage graticules are used for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same graticule in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centered on a glass disc mounted in a black anodized aluminum slide 75 mm x 24 mm x 2 mm thick.
Scale: Horizontal
Length: 20 mm
Divisions: 200 each 0.01 mm
Electron Microscopy Sciences Indexed Grid Graticle NE11A, 16 mm, 10 x 10 mm with 1.0 mm pitch
Useful for particle counting, particularly when reference is needed between workers. Also, they are useful for area of specimen determinations. Indexed grid marked 1-10 and A-J.
Size: 16 mm
Divisions: 10 x 10 mm with 1.0 mm pitch
Surface: Chrome image